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50th Anniversary of Atomic Resolution Microscopy:
Dedicated to the Memory of Erwin W. Müller


Micrograph
Field Ion Microscope image of a rhenium Surface; E.W. Müller
The Penn State Physics Department, in association with the International Field Emission Society, will hold a conference on the Fiftieth Anniversary of Atomic Resolution Microscopy from June 15 to 17, 2005, on the University Park campus in State College, Pennsylvania. The conference is intended to celebrate the historic achievement of atomic resolution microscopy, with Erwin Müller's field ion microscope, at Penn State in 1955. Eminent speakers will address the origins and applications of present-day atomic-scale imaging and related analysis techniques such as field ion microscopy, atom-probe mass spectroscopy, scanning transmission electron microscopy, high-resolution transmission electron microscopy, holographic high-resolution electron microscopy, and scanning probe microscopies. The first person in history to see atomic resolution will share his and Müller's original reactions, making this conference a unique international event. It will be of great interest to all microscopists, materials scientists, and surface scientists.

Members of the international press will be invited, and an effort will be made to illustrate to them how atomic-scale imaging affects everyday life--everything from cell phones to airplanes to drugs require this capability. Our celebration will emphasize the historic significance of the fiftieth anniversary of the first time that atoms were resolved by humans.


Scope of the Conference

Atomic resolution microscopy became a reality in the autumn of 1955 in the laboratory of Erwin W. Müller at Penn State. This historic event will be described by eyewitnesses. Invited speakers will then trace the subsequent development of FIM and its growth into an analytic instrument through the introduction of atom-probe mass analysis by Müller in 1967, the evolution of the atom probe into a 3-D atomic tomography instrument, and the achievement of atomic resolution imaging by STEM, HRTEM, and, later, STM. Applications of these powerful microscopies to surface science, materials science, and bioscience will be addressed by invited and contributed papers.


Who Should Attend the Conference

This conference promises to be valuable for engineers, scientists, and students interested in getting a historically accurate picture of the origins and development of modern atomic resolution microscopies. It will also provide a complete overview of the various instruments of atomic resolution microscopy, presented by world-renowned scientists, including some who originated the microscopies.

an outreach program of the Eberly College of Science


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