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50th Anniversary of Atomic Resolution Microscopy:
Dedicated to the Memory of Erwin W. Müller
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Field Ion Microscope image of a rhenium Surface; E.W. Müller
| The Penn
State Physics Department, in association with the International Field Emission
Society, will hold a conference on the Fiftieth Anniversary of Atomic Resolution
Microscopy from June 15 to 17, 2005, on the University Park campus in State
College, Pennsylvania. The conference is intended to celebrate the historic achievement
of atomic resolution microscopy, with Erwin Müller's field ion microscope, at
Penn State in 1955. Eminent speakers will address the origins and applications
of present-day atomic-scale imaging and related analysis techniques such as field
ion microscopy, atom-probe mass spectroscopy, scanning transmission electron microscopy,
high-resolution transmission electron microscopy, holographic high-resolution
electron microscopy, and scanning probe microscopies. The first person in history
to see atomic resolution will share his and Müller's original reactions, making
this conference a unique international event. It will be of great interest to
all microscopists, materials scientists, and surface scientists. Members
of the international press will be invited, and an effort will be made to illustrate
to them how atomic-scale imaging affects everyday life--everything from cell phones
to airplanes to drugs require this capability. Our celebration will emphasize
the historic significance of the fiftieth anniversary of the first time that atoms
were resolved by humans. Scope of the Conference
Atomic resolution microscopy became a reality in the autumn of 1955 in the laboratory
of Erwin W. Müller at Penn State. This historic event will be described by eyewitnesses.
Invited speakers will then trace the subsequent development of FIM and its growth
into an analytic instrument through the introduction of atom-probe mass analysis
by Müller in 1967, the evolution of the atom probe into a 3-D atomic tomography
instrument, and the achievement of atomic resolution imaging by STEM, HRTEM, and,
later, STM. Applications of these powerful microscopies to surface science, materials
science, and bioscience will be addressed by invited and contributed papers.
Who Should Attend the Conference
This conference promises
to be valuable for engineers, scientists, and students interested in getting a
historically accurate picture of the origins and development of modern atomic
resolution microscopies. It will also provide a complete overview of the various
instruments of atomic resolution microscopy, presented by world-renowned scientists,
including some who originated the microscopies.
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